Test system including a test circuit board including resistive devices
US7131047B2 · kind B2 · utility
6Cited by
12References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 7, 2003 |
| Grant date | Oct 31, 2006 |
| Priority date | — |
| Expiry date | Oct 24, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K2201/09627
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system includes a device under test and a test circuit board. The device under test includes a plurality of contacts configured to provide output signals. The test circuit board may convey the output signals from the device under test to an analyzer. The test circuit board may include a dielectric layer, a via extending through the dielectric layer, a conductor formed on the dielectric layer and a resistive annular ring having a predetermined resistance value. The resistive annular ring may be formed around the via and may be electrically coupled between the via and the conductor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.