Patent · US Expired

High throughput multi-dimensional sample analysis

US7132650B1 · kind B1 · utility

19Cited by
12References
65Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 25, 2004
Grant dateNov 7, 2006
Priority date
Expiry dateMay 3, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T436/115831
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

High throughput analytical systems and methods employing multiple liquid phase separation process regions coupled to a common mass spectrometer are provided. Disclosed systems and methods permits parallel separation and parallel storage of discrete eluate fractions, followed by sequential discharge and ionization of previously stored eluate portions to yield a composite ion stream containing the sequential series of eluate portions, followed by mass analysis of the ion stream. A common manifold may receive ions and utilize pressurized gas or ion gating to direct ions within the manifold toward the mass spectrometer inlet.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.