Method for radiological examination of an object
US7133494B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 2, 2003 |
| Grant date | Nov 7, 2006 |
| Priority date | — |
| Expiry date | Jul 2, 2023 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/583
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The invention relates to a method for x-ray examination of an object where two categories of materials are taken into consideration, comprising: the use of broad spectrum x-rays; measurements of the x-rays by bands of the spectrum; expressions ({circumflex over (M)}) of thicknesses or masses of the two categories of materials passed through by the x-rays, the expressions ({circumflex over (M)}) being functions of at least two of the measurements (mesk) and coefficients (A); and applying a selection criterion from among the expressions ({circumflex over (M)}) to deduce from this an expression (final {circumflex over (M)}) considered true; characterized in that the selection criterion comprises a combination (f) of the expressions with weighting factors (a), and a calculation of the weighting factors such that the combination has minimal variation according to variations of the measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.