Method, apparatus, system, program and medium for inspecting a circuit board and an apparatus incorporating the circuit board
US7133797B2 · kind B2 · utility
1Cited by
3References
61Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 30, 2004 |
| Grant date | Nov 7, 2006 |
| Priority date | — |
| Expiry date | Jan 25, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31703
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, apparatus, system, computer program and medium, for inspecting a wide variety of circuit boards. A controller generates test data and reference data according to characteristic information of a circuit board. Using the test data, the circuit board generates processed data. A comparator compares the processed data with the reference data on a bit-by-bit basis. Based on the comparison result, the comparator determines acceptability of the circuit board. In addition, the comparator is capable of specifying a specific portion of the circuit board causing a defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.