Patent · US Expired

Fractal structure and method of forming it

US7135071B2 · kind B2 · utility

0Cited by
0References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 24, 2001
Grant dateNov 14, 2006
Priority date
Expiry dateMay 30, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01F41/30
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A fractal structure is formed to have a plurality of regions different in fractal dimension characterizing the self-similarity. The fractal structure is grown from one or more origins under growth conditions providing a first fractal dimension in a first portion of the growth process from the start point of time to a first point of time, and under growth conditions providing a second fractal dimension lower than the first fractal dimension in another portion of the growth process from the first point of time to a second point of time. By adjusting the timing for changing the growth conditions, the fractal structure is controlled in nature of phase transition, such as critical temperature for ferromagnetic phase transition, which occurs in the fractal structure. For enhancing the controllability, the first fractal dimension is preferably larger than 2.7 and the second fractal dimension is preferably smaller than 2.3.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.