Patent · US Expired

Method for fabricating single crystal silicon film

US7135388B2 · kind B2 · utility

58Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 2003
Grant dateNov 14, 2006
Priority date
Expiry dateDec 15, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02691
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a method for fabricating a single crystal silicon thin film at the desired location to the desired size from an amorphous or polycrystalline thin film on a substrate using laser irradiation and laser beam movement along the substrate having the semiconductor thin films being irradiated. This method comprises the steps of: forming a semiconductor layer or a metal thin film on a transparent or semi-transparent substrate; forming a single crystal seed region on the substrate of the desired size by a crystallization method using laser irradiation; and converting the desired region of the semiconductor layer or metal thin film into a single crystal region, using the single crystal seed region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.