Method for the extraction of image features caused by structure light using template information
US7136171B2 · kind B2 · utility
5Cited by
29References
19Claims
0Family size
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Key dates
| Filing date | Dec 19, 2001 |
| Grant date | Nov 14, 2006 |
| Priority date | — |
| Expiry date | Dec 8, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for use with a non-contact range finding and measurement system for generating a template guide representative of the surface of a observed object, and for utilizing the template guide to improve laser stripe signal to noise ratios and to compensate for corrupted regions in images of the observed object to improve measurement accuracy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.