Patent · US Expired

Programmable semi-fusible link read only memory and method of margin testing same

US7136322B2 · kind B2 · utility

18Cited by
5References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 5, 2004
Grant dateNov 14, 2006
Priority date
Expiry dateAug 5, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/5006
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A programmable read only memory includes a matrix of semi-fusible link memory cells, each including a semi-fusible link having an intact impedance and a blown impedance; a bit line voltage supply switching circuit for applying a current to at least one selected bit line; a word line address decoder for selecting a word line; and a program control logic circuit for blowing the semi-fusible links in the memory cells identified by the intersection of the selected word and bit lines; a method is disclosed of testing programmed and unprogrammed read only memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.