Using component-level calibration data to reduce system-level test
US7136770B2 · kind B2 · utility
2Cited by
1References
12Claims
0Family size
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Key dates
| Filing date | Nov 3, 2003 |
| Grant date | Nov 14, 2006 |
| Priority date | — |
| Expiry date | Nov 3, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3447
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Using component-level test data to reduce system test. By modeling a system, sensitivity analysis reveals critical components and parameters of those components required to meet system performance parameters. Critical components are tested for these parameters, and these measurements associated with the components. Systems may be assembled which are modeled to meet the system performance parameters based on the model and the measured parameters. Systems may be assembled and calibration coefficients derived and applied from the model and the measured parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.