Method for evaluating processes for manufacturing components
US7136776B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 29, 2004 |
| Grant date | Nov 14, 2006 |
| Priority date | — |
| Expiry date | Oct 29, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2223/02
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
Embodiments of the present invention pertain to methods of evaluating processes for manufacturing components. In one embodiment, an average probability of a first component to fail is calculated based on a measurement of a parameter where the first component was built using a new process. Another average probability of a second component to fail is calculated based on a measurement of the parameter where the second component was built using an existing process. A process index is calculated by determining a difference between the average probabilities for the second component and the first component. An estimation is made as to whether the new process is better than the existing process based on the process index.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.