Patent · US Expired

Method and apparatus for improving reliability in microprocessors

US7137028B2 · kind B2 · utility

4Cited by
7References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 27, 2004
Grant dateNov 14, 2006
Priority date
Expiry dateJul 16, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/1641
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and system provides an increased robustness and protection against the occurrence of soft errors in parallel connect functional redundancy checking processors. This is achieved by predicting in advance the likely occurrence of a soft error and its impact on the resulting instruction flow and using already existing circuit implementations to hide the transient error.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.