Patent · US Expired

Layout method of semiconductor integrated circuit, layout structure thereof, and photomask for forming the layout structure

US7137092B2 · kind B2 · utility

316Cited by
17References
28Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 10, 2004
Grant dateNov 14, 2006
Priority date
Expiry dateJan 18, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A plurality of standard cells 10 are arranged to form a channel-less standard cell array 1, which has vertical and horizontal sides. A plurality of first proximity dummy cells 20 are arranged along each of the vertical sides of the standard cell array to form a first proximity dummy bands 20 such that the upper and lower sides of the first proximity dummy cells are in contact with each other and such that the left or right side of each of the first proximity dummy cells is in contact with the vertical side of the standard cell array 1. Furthermore, a plurality of second proximity dummy bands are arranged along each of the horizontal sides of the standard cell array to form a second proximity dummy bands such that the upper or lower side of each of the second proximity dummy cells is in contact with the horizontal side of the standard cell 1.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.