Apparatus for providing enhanced self-resistive specimen heating in dynamic material testing systems and accompanying method for use therein
US7137306B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2004 |
| Grant date | Nov 21, 2006 |
| Priority date | — |
| Expiry date | Sep 15, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and an accompanying method for use in a conventional dynamic material testing system to advantageously provide enhanced self-resistive specimen heating. Specifically, a fixture (400) is added to the system. The fixture has two supporting arms (201, 451), each holding one of two opposing and conductive anvil assemblies (200, 453). The fixture applies adequate force to each arm sufficient to hold a specimen (466) in position between the anvil assemblies and establish a good abutting electrical contact between the specimen and each assembly but without exerting enough force to deform the specimen as it is being heated. Separate opposing and existing coaxially-oriented shafts (406, 408) controllably strike both arms and move the anvils together, hence squeezing the specimen and generating each deformation therein. Electrical heating current is controllably applied through the support arms, the anvils and the specimen in order to self-resistively heat the specimen in a predefined temporal manner with respect to the specimen deformations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.