Patent · US Expired

Device for measuring quantities of heat while simultaneously measuring the evaporation kinetics and/or condensation kinetics of the most minute amounts of liquid in order to determine thermodynamic parameters

US7137734B2 · kind B2 · utility

3Cited by
8References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 11, 2003
Grant dateNov 21, 2006
Priority date
Expiry dateFeb 11, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N25/4846
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a device for measuring quantities of heat while simultaneously measuring the evaporation kinetics and/or condensation kinetics of the most minute amounts of liquid in order to determine thermodynamic parameters. The aim of the invention is to determine low thermal outputs, which are absorbed or released by the sample, as well as small differences between thermal outputs with regard to a reference measurement of the same magnitude. To this end, a most minute amount of liquid is located inside a measuring chamber having a constant temperature and air humidity. At least one thermal sensor is provided for repeatedly measuring the thermal radiation emitted from the most minute amount of liquid. A measuring means serves to determine the time-dependent change in the most minute amount of liquid. A computer is assigned to the measuring chamber in order to register, display, evaluate and/or subsequently process the measured values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.