Calibration pattern unit photographed by an imaging system to acquire an image for obtaining correction information
US7138645B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2003 |
| Grant date | Nov 21, 2006 |
| Priority date | — |
| Expiry date | Feb 1, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system is formed by combining a plurality of three-dimensionally arranged planes. The calibration pattern unit comprises supporting members each of which has a predetermined surface corresponding to one of the planes, and a calibration pattern in which a predetermined pattern is formed on the predetermined surface of the supporting member. The supporting member can selectively set the calibration pattern unit to a first form for photographing when the correction information is obtained, and a second form for other purposes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.