Patent · US Expired

Interferometric measuring device

US7139079B2 · kind B2 · utility

4Cited by
6References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 16, 2002
Grant dateNov 21, 2006
Priority date
Expiry dateDec 10, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B9/0209
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An interferometric measuring device for measuring a surface or an interface of an object to be measured is provided. The effect of vibration on the measurement result is suppressed by providing a connecting unit by which at least one section of the measuring device assigned to the object to be measured is mechanically rigidly and detachably connectable directly to the object to be measured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.