Shape analysis of surfaces
US7139602B2 · kind B2 · utility
1Cited by
5References
10Claims
0Family size
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Key dates
| Filing date | Apr 26, 2002 |
| Grant date | Nov 21, 2006 |
| Priority date | — |
| Expiry date | Oct 24, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/431
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method and apparatus are provided to map the shape or thickness of a surface. Thickness estimates across a distance are received, and Fourier analysis is performed to generate Fourier amplitude coefficients and phase values for a number of frequency components. Linear discriminant functions are used to characterize the resulting shape as normal or not. Discriminant functions are provided that aid in the diagnosis of glaucoma when the thickness measured is the retinal nerve fiber layer thickness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.