Patent · US Expired

Method for manufacturing device

US7141515B2 · kind B2 · utility

0Cited by
2References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 22, 2004
Grant dateNov 28, 2006
Priority date
Expiry dateDec 26, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B2006/121
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method for manufacturing a device where an improvement of etching accuracy and curtailing of manufacturing costs are realized when a device is manufactured attended with etching, such as RIE, in which a device; i.e., an object of etching, evolves heat.The method includes a coating step of applying over the surface of a device a photosensitive resin containing a phenol-based resin as a main ingredient; a transfer step of transferring a desired pattern on a device surface coated with the photosensitive resin by means of exposing the device surface coated with the photosensitive resin to light with the desired pattern; a development step of subjecting to development treatment the device having the pattern transferred thereon; and an etching step of etching the device surface while the pattern of the photosensitive resin developed through the development treatment is taken as a mask pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.