Measuring apparatus
US7144153B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 31, 2004 |
| Grant date | Dec 5, 2006 |
| Priority date | — |
| Expiry date | Oct 12, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/553
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a surface plasmon resonance sensor, a sensor unit includes a dielectric block, a thin film layer which is formed on the upper surface of the dielectric block, and a sample holding portion. An incubator is provided, the surface plasmon resonance sensor is spatially isolated from the surroundings by placing it in the measuring system, the temperature of the measuring system is measured and temperature change of the sensor unit after it is conveyed to the measuring system from the incubator is estimated on the basis of the temperature difference between the temperature of the incubator and the temperature of the measuring system, and the sensor unit is conveyed to the measuring system to perform the measurement within a time for which the temperature of the sensor unit does not unacceptably change.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.