Methods and devices for analyzing crystalline content of precipitates and crystals without isolation
US7144457B1 · kind B1 · utility
4Cited by
1References
20Claims
0Family size
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Key dates
| Filing date | Mar 20, 2003 |
| Grant date | Dec 5, 2006 |
| Priority date | — |
| Expiry date | Feb 4, 2025 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC30B29/58
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
Systems and methods are provided for evaluating a crystallization experiment, where a crystallization experiment of a molecule is to X-rays while housed within a container in which the crystallization experiment is performed; and one or more X-ray diffraction patterns from the X-ray exposure are used to evaluate whether crystalline material is present in the crystallization experiment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.