Patent · US Expired

Method of producing crystalline semiconductor material and method of fabricating semiconductor device

US7144793B2 · kind B2 · utility

36Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 21, 2003
Grant dateDec 5, 2006
Priority date
Expiry dateSep 19, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/0229
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Disclosed are a method of producing a crystalline semiconductor material capable of improving the crystallinity and a method of fabricating a semiconductor device using the crystalline semiconductor material. An amorphous film is uniformly irradiated with a pulse laser beam (energy beam) emitted from an XeCl excimer laser by 150 times so as to heat the amorphous film at such a temperature as to partially melt crystal grains having the {100} orientations with respect to the vertical direction of a substrate and melt amorphous film or crystal grains having face orientations other than the {100} orientations. Silicon crystals having the {100} orientations newly occur between a silicon oxide film and liquid-phase silicon and are bonded to each other at random, to newly form crystal grains having the {100} orientations. Such a crystal grain creation step is repeated, to form a crystalline film which has crystal grains preferentially grown in the {100} orientations with respect to the vertical direction of the substrate and thereby has sharp square-shaped crystal grain boundaries.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.