Methods and systems for measuring terrain height
US7145501B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 26, 2005 |
| Grant date | Dec 5, 2006 |
| Priority date | — |
| Expiry date | Sep 26, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S19/47
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An altitude measuring system is described that includes a radar altimeter configured to measure altitude and a digital terrain map database. The database includes data relating to terrain elevation and at least one data parameter relating to an accuracy of the terrain elevation data and the altitude measured by the radar altimeter. The system is configured to weigh an altitude derived from the terrain elevation data and the radar altimeter measurements according to the at least one data parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.