Probe for use in determining an attribute of a coating on a substrate
US7148712B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 24, 2005 |
| Grant date | Dec 12, 2006 |
| Priority date | — |
| Expiry date | Jun 24, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06788
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe provides electrical communication between a coating and a processing system. One optional feature includes an outwardly projecting, electrically conductive engaging member that is held in a captivation structure releasably retained in a housing and engages a contact that is inside the probe and connected with the processing system. Another optional feature of the probe provides the electrically conductive engaging member in the form of a pin or pins captivated in a light-transmissive structure adjacent a light-emitting source. Another optional feature of the probe includes a restraining structure that defines a frustoconical seat for engaging a conical distal end of an electrically conductive pin that is adapted to contact the coating.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.