Method of detecting flaws in the structure of a surface
US7149337B2 · kind B2 · utility
37Cited by
8References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2001 |
| Grant date | Dec 12, 2006 |
| Priority date | — |
| Expiry date | Dec 22, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method of detecting flaws in the surface of a test object relative to the surface of a flawless master part by constructing in an artificial neuronal net a virtual master part for comparison with characteristic numbers derived from the grey values of sequential images of the test object recorded by a digital camera.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.