Patent · US Expired

Method of detecting flaws in the structure of a surface

US7149337B2 · kind B2 · utility

37Cited by
8References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 21, 2001
Grant dateDec 12, 2006
Priority date
Expiry dateDec 22, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T7/521
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a method of detecting flaws in the surface of a test object relative to the surface of a flawless master part by constructing in an artificial neuronal net a virtual master part for comparison with characteristic numbers derived from the grey values of sequential images of the test object recorded by a digital camera.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.