Non-destructive inspection of downhole equipment
US7149339B2 · kind B2 · utility
55Cited by
14References
48Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 25, 2003 |
| Grant date | Dec 12, 2006 |
| Priority date | — |
| Expiry date | Mar 21, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides non-destructive computed tomography (CT) methods of testing downhole equipment. The non-destructive CT methods enable both extrinsic and intrinsic testing to ensure the quality of downhole components in elements such as downhole packers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.