Method and apparatus for non-obtrusive power profiling
US7149636B2 · kind B2 · utility
8Cited by
4References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 19, 2002 |
| Grant date | Dec 12, 2006 |
| Priority date | — |
| Expiry date | Dec 3, 2024 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for improved power profiling of embedded applications are presented. These inventions provide the ability to unobtrusively measure the power consumption of an embedded application as the application is executing on its target hardware. The unobtrusiveness is achieved by using programmable emulation circuitry in the target system processor and available device debug terminals on the test port.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.