Patent · US Expired

Method for error correction decoding in a magnetoresistive solid-state storage device

US7149949B2 · kind B2 · utility

3Cited by
43References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2002
Grant dateDec 12, 2006
Priority date
Expiry dateSep 23, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/1008
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A magnetoresistive solid-state storage device (MRAM) employs error correction coding (ECC) to form ECC encoded stored data. In a read operation, a set of test cells in a test row are used to predict failures amongst a set of cells of interest storing a block of ECC encoded data. Erasure information is formed from these predictions which identifies potentially unreliable symbols in the block of ECC encoded data, and the ability of a decoder to perform ECC decoding is substantially enhanced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.