Patent · US Expired

Method for classifying object image regions of an object to be detected using a scanning microscope

US7151270B2 · kind B2 · utility

19Cited by

4References

25Claims

0Family size

Assignee

LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

Holger Birk · Meckesheim, DE
Rafael Storz · Heidelberg, DE

Key dates

Filing date	Apr 28, 2004
Grant date	Dec 19, 2006
Priority date	—
Expiry date	Jul 14, 2024

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/6428
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for classifying a plurality of object image regions of an object to be detected using a scanning microscope includes labeling each of the image areas of the object with a different marker so that light of a respective characteristic emanates from each marker. The intensity of the light from each marker is detected using at least two channels so as to generate detection signals, each detection signal being a function of the intensity of the detected light. The object regions are classified using ratios of the detection signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.