System and method for characterizing a potential distribution
US7151417B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 16, 2004 |
| Grant date | Dec 19, 2006 |
| Priority date | — |
| Expiry date | Jun 16, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31716
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for characterizing an operating parameter in an integrated circuit, in accordance with one embodiment of the present invention, includes a voltage potential module, a plurality of distribution systems and a plurality of ring oscillator modules. Each ring oscillator module is coupled to the voltage potential module by a respective distribution system. Each ring oscillator module generates an oscillator signal as a function of the voltage potential and a voltage drop caused by the respective distribution system. The characterization of the operating parameter may be extrapolated from the difference in the operating frequencies of the ring oscillator modules.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.