Patent · US Expired

Test device for signaling and waveform generation and monitoring

US7155362B2 · kind B2 · utility

3Cited by
7References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 23, 2004
Grant dateDec 26, 2006
Priority date
Expiry dateOct 24, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3271
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for generating a signal for testing a relay is provided. The system includes a plurality of argument vector arrays, each defines a digital signal for testing the relay. Each of the argument vector arrays includes a plurality of argument vectors and each argument vector includes a plurality of arguments. The system includes a plurality of waveform generators to generate a plurality of signal components. Each waveform generator generates the signal component based on the argument vectors contained by a selected one of the plurality of argument vector arrays. The system also includes a merge component to combine the signal components to produce the digital signal for testing the relay.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.