Analog-to-digital converter capable of performing self-test
US7158070B1 · kind B1 · utility
22Cited by
1References
7Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 21, 2005 |
| Grant date | Jan 2, 2007 |
| Priority date | — |
| Expiry date | Dec 21, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/46
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
While transforming an analog input voltage into a digital signal including several bits, an analog-to-digital converter including a built-in self test (BIST) circuit is used for performing the transformation and compensating an offset error of the analog input voltage. The operations of the digital-to-analog converter include a self test mode and a normal mode. And each of the self test mode and the normal mode includes a sampling phase and a bit cycling phase.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.