Systems and methods for configuring a test setup
US7158907B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 4, 2004 |
| Grant date | Jan 2, 2007 |
| Priority date | — |
| Expiry date | Dec 4, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3684
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods for configuring a test setup that support reuse of previously defined sub-configuration parameter values without reference to individually-named sub-configuration files are provided. In these methods, each sub-configuration parameter value is automatically associated with a test case name within the test, and this association is represented in context data structures. During test configuration, for each set of sub-configuration parameter values, the user may reuse previously-defined values simply by specifying the name of the test associated with the previously-defined values. A system and a user interface for configuring a test setup are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.