Patent · US Expired

Method and device for the high-precision machining of the surface of an object, especially for polishing and lapping semiconductor substrates

US7160177B2 · kind B2 · utility

4Cited by
12References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 23, 2004
Grant dateJan 9, 2007
Priority date
Expiry dateJan 23, 2024

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B49/16
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A device for high-precision machining of the surface of an object, such as for polishing and lapping semiconductor substrates, in which the object is held on an accommodation surface for its machining. The accommodation surface can be deformed by means of a actuators connected to the surface in a positive-lock and/or non-positive-lock manner. The actuators are provided between a base plate and an accommodation plate that are mechanically biased relative to one another. The accommodation plate is configured, on its inside, with concentric grooves forming rigid rings in the axial direction. The individual rings are connected by solid substance joints. Piezo-stacks configured as actuator-sensor elements, as well as springs, are disposed between the faces of the rings and the base plates and are offset relative to one another by 120°.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.