Patent · US Expired

Method and device for measuring stress

US7160253B2 · kind B2 · utility

49Cited by
8References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 10, 2003
Grant dateJan 9, 2007
Priority date
Expiry dateJan 14, 2025

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B5/6887
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

The invention relates to a method and an electronic device for implementing the method for measuring mental load. The electronic device generates at least two different cognitively loading tasks for the person participating in the measurement, the first task determining a reference level and at least one other task determining the loading capacity level. The electronic device determines the pulse parameters of the person participating in the measurement during the cognitively loading tasks. The electronic device also compares the pulse parameters during the different tasks with each other. Finally, the electronic device generates a value descriptive of the mental load of the person participating in the measurement on the basis of the comparison of the pulse parameters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.