Hidden feature characterization using a database of sensor responses

US7161351B2 · kind B2 · utility

Assignee

• JENTEK Sensors, Inc. · US

Inventors

• Neil J. Goldfine · Newton, US
• Vladimir A. Zilberstein · Sharon, US
• Darrell E. Schlicker · Watertown, US
• David C. Grundy · Reading, US
• Ian Shay · Cambridge, US
• Robert Joseph Lyons · Niskayuna, US
• Andrew P. Washabaugh · Chula Vista, US

Key dates

• Filing date: Sep 3, 2004
• Grant date: Jan 9, 2007
• Expiry date: Feb 27, 2025

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N27/9046
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown model parameters, such as the electrical conductivity, magnetic permeability, dielectric permittivity, thermal conductivity, and/or layer thickness. These parameter responses are then used to obtain a quantitative estimate of a property of a hidden feature, such as corrosion loss layer thicknesses, inclusion size and depth, or stress variation. The sensors can be single element sensors or sensor arrays and impose an interrogation electric, magnetic, or thermal field.