Patent · US Expired

Voltage/current testing equipment for microfluidic devices

US7161356B1 · kind B1 · utility

120Cited by
43References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 12, 2003
Grant dateJan 9, 2007
Priority date
Expiry dateFeb 5, 2025

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB01L2400/0487
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

The present invention provides novel methods and devices for testing/verifying the configuration of one or more microfluidic elements in a microfluidic device. In particular the methods and devices of the invention are useful in testing for blockages or the presence of air bubbles in microfluidic elements. For example, a method for verifying the proper function of a microfluidic device is disclosed, which device comprises at least first, second and third fluidic openings, which fluidic openings are fluidly coupled to at least first, second and third microscale channel elements, respectively, the method comprising flowing an electrically conductive buffer through the first, second and third microscale channel elements; setting a known applied voltage potential (or current) between the first and second fluidic openings; setting a current in the third microscale channel element to be approximately zero; detecting a resulting voltage at the third fluidic opening; and, comparing the detected voltage at the third fluidic opening with a calculated target voltage expected at the third fluidic opening to determine whether there is a fault or problem (e.g., air bubble) in at least one of the…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.