Enhanced sample processing devices, systems and methods
US7164107B2 · kind B2 · utility
44Cited by
53References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2005 |
| Grant date | Jan 16, 2007 |
| Priority date | — |
| Expiry date | Nov 23, 2025 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/2575
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Devices, systems, and methods for processing sample materials. The sample materials may be located in a plurality of process chambers in the device, which is rotated during heating of the sample materials.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.