Method and system for testing RFID devices
US7164353B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2004 |
| Grant date | Jan 16, 2007 |
| Priority date | — |
| Expiry date | Jun 19, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K7/0095
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for testing a plurality of RFID devices disposed on a common carrier. In one embodiment, the RFID devices are evenly spaced along the length of the carrier, and the system comprises a short-range tester, a long-range tester and a computer, the short-range tester being coupled to the computer and having a short-range testing position, the long-range tester being coupled to the computer and having a long-range testing position, the long-range testing position being spaced downstream from the short-range testing position by a known number of device positions. In use, an RFID device of interest is first positioned at the short-range testing position, and the short-range tester reads a unique identifier for that RFID device and communicates the identifier to the computer. The carrier is then advanced so that subsequent RFID devices are read by the short-range tester. When the RFID device of interest has advanced to the long-range testing position, the long-range tester conducts a performance test and communicates any detected results to the computer. Because the distance between the two testing positions is known, the computer knows when the RFID device of interest i…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.