Non-destructive inspection of material in container
US7164750B2 · kind B2 · utility
81Cited by
2References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2004 |
| Grant date | Jan 16, 2007 |
| Priority date | — |
| Expiry date | Jun 25, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for non-destructive inspection of materials housed in containers involves orienting an X-ray beam emitter and detector to direct and detect an X-ray beam at an angle substantially parallel to a sloped surface of the container to be inspected. A first X-ray apparatus is located opposite a second X-ray apparatus, and both the first and second X-ray apparatus are adapted to provide two X-ray beams. This arrangement provides for imaging of the entire area of a sloped portion of the container without any shadow or hidden spots.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.