Test device and method of making same

US7166459B2 · kind B2 · utility

Assignee

• SURFACE LOGIX, LLC · US

Inventors

• Gregory L. Kirk · Pleasanton, US
• Matthew S. Brown · Falkner, US
• Emanuele Ostuni · Cambridge, US
• Enoch Kim · Boston, US
• Bernardo D. Aumond · Somerville, US
• Olivier Schueller · Somerville, US
• Paul Sweetnam · Marblehead, US
• Brian Benoit · Westborough, US

Key dates

• Filing date: Mar 15, 2002
• Grant date: Jan 23, 2007
• Expiry date: Sep 1, 2023

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10S435/81
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present invention discloses a test device including a support member; a top member mounted to the support member, wherein in the support member and the top member are configured such that they together define a discrete chamber. The discrete chamber includes a first well region including at least one first well; a second well region including at least one second well; and a channel region including at least one channel connecting the first well region and the second well region with one another. The second region is preferably horizontally offset with respect to the first well region in a test orientation of the device.