Method and apparatus for determining electrical properties of structures
US7167009B2 · kind B2 · utility
9Cited by
55References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 24, 2004 |
| Grant date | Jan 23, 2007 |
| Priority date | — |
| Expiry date | Sep 24, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M5/0041
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for determining an electrical property of a structure. The method involves creating a model of an electrical property of a structure and measuring the electrical property of the structure between at least two of a plurality of locations. The method also involves determining the electrical property of at least a portion of the structure based on the model and the measurement of the electrical property between the at least two of the plurality of locations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.