Method and system for determining characteristics of optical signals on spatial light modulator surfaces
US7167143B2 · kind B2 · utility
1Cited by
4References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 30, 2003 |
| Grant date | Jan 23, 2007 |
| Priority date | — |
| Expiry date | Jun 16, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/2931
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The present application describes a system and method for determining characteristics (e.g., exact band location, orientation and height and the spot shape and size of a single wavelength and the like) of an optical signal projected on a spatial light modulator. In an embodiment, images with sharper edges (i.e. clear boundary between ‘on’ pixels and ‘off’ pixels) on the spatial light modulator are used to obtain spectral information from a referenced broadband source. The spectral information can be used to determine the desired characteristics of optical signals projected on the spatial light modulator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.