Utilization of an infrared probe to discriminate between materials
US7167742B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 9, 2002 |
| Grant date | Jan 23, 2007 |
| Priority date | — |
| Expiry date | Jan 21, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0846
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of evaluating the surface of a material that has a distinguishable infrared spectrum comprising (a) positioning an infrared fiber optic probe to be in contact with a surface of the sample or material at a region of interest for detecting attenuated total reflectance or within a sufficient distance from the surface of the region for detecting reflection, (b) detecting mid- or near-infrared radiation attenuated total reflectance or reflection off of the surface of the sample or the material, (c) analyzing the infrared radiation from step (b) for at least one of peak height, peak area, frequency and chemometric parameters, and (d) actuating the removal device when a signal from the infrared fiber optic probe is between pre-selected values for at least one of peak height, peak area, frequency and chemometric parameters for the sample of the material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.