X-ray device

US7170974B2 · kind B2 · utility

Inventors

• Burkhard Groh · Chicago, US
• Volker Heer · Gundelsheim, DE
• Mathias Hömig · Erlangen, DE
• Bernhard Sandkamp · Erlangen, DE

Key dates

• Filing date: Nov 18, 2004
• Grant date: Jan 30, 2007
• Expiry date: Mar 10, 2025

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N23/04
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An X-ray device (1) is provided including an X-ray source (8) and a first X-ray detector (9,100) for producing a first X-ray image data set of an examination object (P). A second X-ray detector (20) is provided for producing a second X-ray image data set of examination object (P) where the second X-ray detector (20) has a smaller detector surface (23) than the first X-ray detector (9,100). The second X-ray detector (20) may produce an X-ray image associated with the second X-ray image data set that has a higher local resolution than the X-ray image (12) associated with the first X-ray image data set. The second X-ray detector (20) may be movably connected with the first X-ray detector (9,100) so the second X-ray detector (20) maybe articulated upstream of the first X-ray detector (9,100).