System and method for identifying defects in a composite structure
US7171033B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 28, 2001 |
| Grant date | Jan 30, 2007 |
| Priority date | — |
| Expiry date | Sep 29, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30124
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for identifying defects in a composite structure is provided. The system includes a camera for receiving images of the composite structure, a processor for manipulating the images and outputting a response based on the images, and a light source for illuminating the composite structure. Advantageously, the light source is positioned at an oblique angle relative to the composite structure and comprises an infrared component that is differently reflected by defects in the composite structure than from portions of the composite structure that are defect free. Based on the response provided by the processor, defects that meet predetermined criteria can be identified.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.