Enterprise test system having run time test object generation
US7171588B2 · kind B2 · utility
15Cited by
10References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 6, 2001 |
| Grant date | Jan 30, 2007 |
| Priority date | — |
| Expiry date | Jan 19, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/87
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An enterprise test system for synthesizing complex objects to exercise an application under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.