Nondestructive inspection apparatus and nondestructive inspection method using elastic guided wave
US7171854B2 · kind B2 · utility
55Cited by
6References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 19, 2004 |
| Grant date | Feb 6, 2007 |
| Priority date | — |
| Expiry date | Feb 19, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2634
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A nondestructive inspection apparatus using a guided wave having waveform forming part that form a transmission waveform; a transmitting element for generating a guided wave within an object under inspection; a receiving element for receiving a reflection wave of the guided wave from an inspection region of the object under inspection; an analyzing element for outputting inspection information which is acquired based upon the reception waveform of the reflection wave received by the receiving element; and a display for displaying the inspection information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.