High temperature open ended zero insertion force (ZIF) test socket

US7172450B1 · kind B1 · utility

Assignee

• QualiTau, Inc. · US

Inventors

• Robert J. Sylvia · Santa Clara, US
• Adalberto M. Ramirez · Hayward, US
• Jens Ullmann · Oberkochen, DE
• Jose Ysaguirre · Soquel, US
• Peter Cuevas · Los Gatos, US
• Maurice C. Evans · Oakland, US

Key dates

• Filing date: Jan 11, 2006
• Grant date: Feb 6, 2007
• Expiry date: Jan 11, 2026

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10S439/912
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A socket for use in testing packaged integrated circuits having leads depending therefrom includes a first member for receiving the integrated circuit package and having a plurality of holes for receiving leads extending from the package. A second member has a plurality of wire contacts for engaging the leads, the first and second members being arranged to permit relative lateral translation thereof. A support frame includes a first portion which physically engages the first member and a second portion which physically engages the second member. A lever or handle is attached to the second portion and includes a cam surface for engaging a cam follower on the first portion for imparting relative lateral motion between the two members whereby the package leads physically engage wires of the second member.