Methods and systems for positron emission tomography data correction
US7173248B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 20, 2004 |
| Grant date | Feb 6, 2007 |
| Priority date | — |
| Expiry date | Nov 5, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2211/424
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems for image overlap correction are provided. The method includes acquiring the emission projection data from a plurality of scan frames that extend across at least a portion of a length of an object being imaged wherein elements of the object lie between a region of overlap between two successive frames. The method further includes iteratively reconstructing a 3D image volume from multi-frame emission projection data by updating an estimate of 3D image volume using emission projection data from the plurality of frames within an iterative reconstruction loop.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.