Patent · US Expired

Circuit property measurement method

US7173433B2 · kind B2 · utility

19Cited by
3References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 11, 2005
Grant dateFeb 6, 2007
Priority date—
Expiry dateFeb 11, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a high frequency circuit property measurement method, prior to property measurements of a high frequency circuit with RF measurement probe heads, RF measurement probe heads are calibrated using a calibration pattern comprising a signal line having a characteristic impedance and extending on a dielectric substrate, a first GND pad having one end disposed close to and at an interval from a first end of the signal line, a second GND pad having one end disposed close to and at an interval from a second end of the signal line, and a conductor electrically coupling the first GND pad to the second GND pad.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.